Phemet®

Wooptix® has developed a system for wafer metrology, Phemet®, that uses WFPI, a proprietary wavefront sensing technique, that measures the topography of a silicon wafer from a single image, enabling the characterization of warpage, bow, and other relevant metrics.  By collecting more than 16 million data points with sub-nanometer height resolution, Phemet is the industry leader in speed and resolution. Wooptix´s systems for wafer inspection and metrology offer the data needed by chip manufacturers to enhance yield through comprehensive traceability in their progressively complex manufacturing procedures. 

Phemet provides the automation capabilities for in-line metrology of 300mm wafers, having a high throughput that allows for the use of its data in feed-forward algorithm or other customized control methods. 

Wooptix Systems empower corporations to swiftly identify, address, and track deviations, ensuring heightened quality control for enhanced device performance.