WOOPTIX

Wooptix is a semiconductor wafer metrology innovator that provides the fastest, most accurate in-line measurements with the highest lateral resolution. Through its use of wavefront phase imaging (WFPI), a proprietary technique derived from research in adaptive optics, its systems measure the shape, uniformity, nanotopography and roughness of the entire silicon wafer in a single image. It is actively deploying solutions at various customer sites across Asia, Europe and North America.

Together with their resistance to vibrations and ease of adapting to the user’s needs, they are valuable systems for measuring the wafer shape and nanotopography in a single image.

Wooptix has developed a system for wafer metrology, Phemet®, that uses WFPI, a proprietary wavefront sensing technique, that measures the topography of a silicon wafer from a single image, enabling the characterization of warpage, bow, and other relevant metrics.  By collecting more than 16 million data points with sub-nanometer height resolution, Phemet® is the industry leader in speed and resolution. Wooptix´s systems for wafer inspection and metrology offer the data needed by chip manufacturers to enhance yield through comprehensive traceability in their progressively complex manufacturing procedures. 

Phemet provides the automation capabilities for in-line metrology of 300mm wafers, having a high throughput that allows for the use of its data in feed-forward algorithm or other customized control methods. 

Wooptix Systems empower corporations to swiftly identify, address, and track deviations, ensuring heightened quality control for enhanced device performance.