Updated on 3 September 2026
Metrology/inspection scanning platform
CEO at Ausmosys
Meyreuil, France
About
High precision surface metrology and inspection are notoriously slow. Large samples, no solution. Multiple samples in trays, requires specific preparation to lock each part or accept very slow measurement.
We are developping a new metrology inspection platform based on decades of know-how acquires in the semiconductor industry.
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Inverted platform : just lay your sample, press start and measure, no preparation, no compromise on speed
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Ultra fast : speed up to 1m/s, acceleration of 1G, all while maintaining µm level accuracy
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Large sample area for very low footprint : measure large parts or large trays without sacrifying floor space
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Multi-instrument : comaptible with vision, confocal sensor, WLI, and many more
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Proprietary motion system, no cascading margins for your ROI
The prototype is currently up and running and we are looking for use cases to solve.
Looking for
- Distribution Partner
- Other
Applies to
- ICT
- Microtechnology
- Biotech and Lifescience
- Luxury & Watchmaking industry
- Energy & Environment
- Aeronautics & Defence
Organisation
Similar opportunities
Product
New generation multi-DOF motion system
- ICT
- Other
- Microtechnology
- Aeronautics & Defence
- Biotech and Lifescience
- Luxury & Watchmaking industry
Laurent RUET
CEO at Ausmosys
Meyreuil, France
Product
ix01 - IotaMetrix stand alone microscope
- ICT
- Health
- Agrifood
- Microtechnology
- Distribution Partner
- Energy & Environment
- Manufacturing Partner
- Aeronautics & Defence
- Biotech and Lifescience
- Luxury & Watchmaking industry
Simon Hédé
Ingénieur Business et innovation at IotaMetrix
Limoges, France
Service
Non-destructive optical analysis of your samples, feasibility study to measurement report
Simon Hédé
Ingénieur Business et innovation at IotaMetrix
Limoges, France