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ProductUpdated on 3 September 2026

Metrology/inspection scanning platform

CEO at Ausmosys

Meyreuil, France

About

High precision surface metrology and inspection are notoriously slow. Large samples, no solution. Multiple samples in trays, requires specific preparation to lock each part or accept very slow measurement.

We are developping a new metrology inspection platform based on decades of know-how acquires in the semiconductor industry.

  • Inverted platform : just lay your sample, press start and measure, no preparation, no compromise on speed

  • Ultra fast : speed up to 1m/s, acceleration of 1G, all while maintaining µm level accuracy

  • Large sample area for very low footprint : measure large parts or large trays without sacrifying floor space

  • Multi-instrument : comaptible with vision, confocal sensor, WLI, and many more

  • Proprietary motion system, no cascading margins for your ROI

The prototype is currently up and running and we are looking for use cases to solve.

Looking for

  • Distribution Partner
  • Other

Applies to

  • ICT
  • Microtechnology
  • Biotech and Lifescience
  • Luxury & Watchmaking industry
  • Energy & Environment
  • Aeronautics & Defence

Organisation

Ausmosys

Small and medium size Enterprise (SME)

Meyreuil, France

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