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ProductUpdated on 16 December 2025

KARAT wafer characterization tools

CEO at Comptek Solutions Oy

Turku, Finland

About

Our KARAT products are base on a multiple wafer characterization platform, combining multiple techniques such as PL, Carrier Lifetime measurements, dark spot and reflectance.

Detailed spatial ,optical and wavelength coverage specifications are tuned according to customer requests based on their particular materials and applications, having the initial setup covering a broad wavelength range 400-2500nm.

Data anlysis is carried out with Comtpek's own data analysis tools, developed during years of characterizing of our own work in areas such as µLED, IR sensing and Lasers.

KARAT tools are designed and made in Finland

Organisation

Comptek Solutions Oy

EU Business Hub ー 中小企業・スタートアップ / SME/startup

Turku, Finland

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