ProductUpdated on 16 December 2025
KARAT wafer characterization tools
CEO at Comptek Solutions Oy
Turku, Finland
About
Our KARAT products are base on a multiple wafer characterization platform, combining multiple techniques such as PL, Carrier Lifetime measurements, dark spot and reflectance.
Detailed spatial ,optical and wavelength coverage specifications are tuned according to customer requests based on their particular materials and applications, having the initial setup covering a broad wavelength range 400-2500nm.
Data anlysis is carried out with Comtpek's own data analysis tools, developed during years of characterizing of our own work in areas such as µLED, IR sensing and Lasers.
KARAT tools are designed and made in Finland
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