STELIO Measurement system for non-contact inspection of materials

Based on the high sensitivity of a local microwave-coupled probe, this measurement system enables non-contact inspection of materials at both the surface and subsurface levels while delivering micrometer-scale spatial resolution.

The system is capable of directly determining residual stress profiles during inspection, allowing the early identification and detection of structural damage such as oxidation and corrosion.

In addition, the solution is designed to adapt to the specific requirements of each application, providing valuable decision-support capabilities. Combined with advanced embedded algorithms, its technical performance makes it a predictive tool capable of anticipating potential failures before they occur.

STELIO Core and STELIO Compact are two solutions designed for manufacturers, OEMs, and industrial companies producing small- to medium-sized components. They provide earlier non-destructive detection of defects in optimized components, as well as direct mechanical measurements at the surface and subsurface levels.