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16 – 19 Dec 2025 | Tokyo, Japan

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ProductUpdated on 16 November 2025

The most advanced test structures and test wafers for high aspect ratio and area selective processes

CEO at Chipmetrics

Joensuu, Finland

About

Ultra-high aspect ratio test structures provide unmatched opportunities for process control, tool qualification and depo/etch process development. Learn our product and service portfolio and take advantage of our super fast deliveries.

Organisation

Chipmetrics

EU Business Hub ー 中小企業・スタートアップ / SME/startup

Joensuu, Finland

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