Service
Wafer inspection for high-mix low-volume production
We provide a software solution to convert image data into defect maps to minimize active testing for high-mix low-volume production.
- Consulting
- Development
- Manufacturing
- High Tech Systems & Materials - Semicon
- High Tech Systems & Materials - Metrology
- High Tech Systems & Materials - Photonica
- High Tech Systems & Materials - Photoresist
- High Tech Systems & Materials - Photonic IC’s
- High Tech Systems & Materials - Dicing & Packaging
- High Tech Systems & Materials - Optical components
- High Tech Systems & Materials - Test Technology & Engineering
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