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ServiceUpdated on 26 June 2025

Wafer inspection for high-mix low-volume production

Rik Wetzels

System architect at Nobleo

Eindhoven, Netherlands

About

Perform defect / surface quality inspection with our on-site machine learning installation. Convert microscopy images into quality info using design information. Our main objective is too support high-mix low-volume production companies to reduce active testing efforts by pre-selecting parts based on our product (defect) maps. We work with your quality, production staff and (wafer/product) designers to set-up an efficient workflow,

Type

  • Development
  • Consulting
  • Manufacturing

Applies to

  • High Tech Systems & Materials - Dicing & Packaging
  • High Tech Systems & Materials - Metrology
  • High Tech Systems & Materials - Optical components
  • High Tech Systems & Materials - Photonic IC’s
  • High Tech Systems & Materials - Photonica
  • High Tech Systems & Materials - Photoresist
  • High Tech Systems & Materials - Semicon
  • High Tech Systems & Materials - Test Technology & Engineering

Organisation

Nobleo

Company

Eindhoven, Netherlands

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