SILICON ALPS Cluster

EBSCON 2025

8 Oct 2025 | Graz, Austria

ExpertiseUpdated on 6 October 2025

Failure analysis

Damijan Movrin

Quality engneer

Graz, Austria

About

Electrical characterisation,package analysis (Scanning acoustic microscopy, SAM, X-ray analysis), die exposure/decapsulation, failure site localisation with thermal techniques (liquid crystal) or photo emisssion microscopy, probing technology, deprocessing, x-section analysis, inspection technologies (e.g. Scanning electron microspcopy with EDX, SIMS, AES)

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