Large-Area Low-Activity Radiation Detector with Defect-Tolerant Readout

The Slovak Academy of Sciences (SAS) offers a large-area detector for low-activity ionizing radiation that expands application possibilities especially when lower-quality (defect-prone) semiconductor substrates are used. The design delivers more accurate measurement results (unaffected by defective areas) while reducing the amount of control/readout electronics, leading to cost savings in both manufacturing and operation.

Key benefits for industry:

• Works with lower-quality semiconductor materials (e.g., CdTe, GaAs, CdZnTe, SiC, InP) and remains functional even with defects (only the effective area is reduced).

• More precise results without post-correction of measured values.

• Simpler construction, higher production yield, and one reading unit instead of many.

• Lower readout/control electronics demands → lower system complexity and operating costs.

Application areas: nuclear energetics (spectrometry, dosimetry), environments with natural or artificial ionizing radiation sources, and space applications.

Development & IP: prototype ready for demonstration (TRL 5); European patent application pending.

We are looking for an industrial partner for licensing or sale of the technology.

Commercialization is supported by the Technology Transfer Office of SAS, which can facilitate the licensing/sale process, contracting, and communication with the IP-holding SAS organization.