Ivan Orlov

We help crystal, watch, optics and semiconductor manufacturers detect internal defects before costly processing steps for a crystal begin. Today, many defects—like cracks or micro-bubbles—are only discovered late in production, after coring, slicing, or polishing, leading to significant material loss. In sapphire alone, this can mean 10–20% rejection rate in final wafers. Our patented inspection systems changes that. By "looking" inside the crystal volume, we help to optimally cut the crystals, improve yield, and lower production costs. Started with inspecting sapphire 10 years ago, we are now working with multitude of crystals - from piezoelectric to laser ones. If you are working with high-value crystals or wafers, we would be glad to explore how early defect detection could help you application.