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ServiceUpdated on 26 August 2025

Wafer inspection for high-mix low-volume production

System architect at Nobleo Technology

Eindhoven, Netherlands

About

Perform defect / surface quality inspection with our on-site machine learning installation. Convert microscopy images into quality info using design information. Our main objective is too support high-mix low-volume production companies to reduce active testing efforts by pre-selecting parts based on our product (defect) maps. We work with your quality, production staff and (wafer/product) designers to set-up an efficient workflow,

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