R-Flex VIS

R-Flex is a versatile optical metrology system that instantly combines any of our wavefront sensors in the 400 – 1100 nm range with a collimator and a light source.

BEST FOR VERSATILITY
- A great choice for lab or industrial application
- Sucessfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics.
- Optimize the aligment of complex systems
- On and off-axis 3D MTF

R-FLEX Visible NIR optical metrology System KEY SPECS
- Multiple options as per focusing objectives and collimating beam sizes
- λ/200 RMS measurement accuracy in double-pass configuration
- Insensitive to vibrations and atmospheric turbulence
- λ/200 rms measurement accuracy in double-pass configuration
- Patented technology, which allows simultaneous and independent measurement of phase and intensity
- Insensitive to vibrations and atmospheric turbulences
- Platform compatible with fibered light sources in 400-1100 nm wavelength range
- Delivered with WaveView metrology software
- Collimated or diverging exit beam with several standard focusing modules from F/0.9
- Removable Visible NIR optical metrology wavefront sensor for using it as a stand-alone unit
- Highly accurate wavefront analysis even with central obscuration and spider-beam types
- Several accessories available , such as laser diode light sources, reference mirrors for calibration, translation stages, etc
- Latest generation of HASO Shack-Hartmann