New CND instrument for industry STELIO

The Stelio device presents itself as an innovative non-destructive testing solution designed for measuring residual stresses in small mechanical parts. This equipment, based on the coupling of confocal microscopy and local probe microwave microscopy, allows for contactless inspection of surface and subsurface materials while offering micrometric spatial resolution. Stelio provides the capability to directly evaluate the distributions of residual stresses in materials. It also facilitates the recognition and early detection of damage within materials, particularly those caused by phenomena such as oxidation or corrosion.