Enterprise Europe Network

Meet the Dutch at Semicon India 2026

17 – 19 Sept 2026 | New Delhi, India

ServiceUpdated on 22 July 2026

Material characterization and inspection service

Saurabh Karwal

Business Developer at Netherlands Organization for Applied Scientific Research

Delft, Netherlands

About

•Material inspection using optical microscopy, AFM, SEM, EDX spectroscopy, Raman and PL spectroscopy, ellipsometry, XPS

•In-depth material characterization including AlOx/Si interface, defect characterization, dielectric properties, metal resistivity at both RT and 4K temperatures

Type

  • Consulting
  • Technology Transfer
  • Research & Development
  • Testing & Analysis

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