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17 – 19 Sept 2026 | New Delhi, India

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ServiceUpdated on 22 July 2026

Material characterization and inspection service

Business Developer at Netherlands Organization for Applied Scientific Research

Delft, Netherlands

About

Material inspection using optical microscopy, AFM, SEM, EDX spectroscopy, Raman and PL spectroscopy, ellipsometry, XPS

In-depth material characterization including AlOx/Si interface, defect characterization, dielectric properties, metal resistivity at both RT and 4K temperatures

Type

  • Consulting
  • Technology Transfer
  • Research & Development
  • Testing & Analysis

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