Updated on 22 July 2026
Material characterization and inspection service
Business Developer at Netherlands Organization for Applied Scientific Research
Delft, Netherlands
About
•Material inspection using optical microscopy, AFM, SEM, EDX spectroscopy, Raman and PL spectroscopy, ellipsometry, XPS
•In-depth material characterization including AlOx/Si interface, defect characterization, dielectric properties, metal resistivity at both RT and 4K temperatures
Type
- Consulting
- Technology Transfer
- Research & Development
- Testing & Analysis
Attached files
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