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ServiceUpdated on 27 March 2025

operando and in situ and ex situ spectroscopy (XPS, XAS, ToF-SIMS) to investigate key interfacial processes

Raheleh Azmi

Senior scientist at the Institute of Applied Materials - Energy Storage Systems (IAM-ESS) at KIT at Project Management Agency Karlsruhe (PTKA)

Karlsruhe, Germany

About

operando and in situ and ex situ spectroscopy (XPS, XAS, ToF-SIMS) to investigate key interfacial processes

Type

  • Research & Development
  • Testing & Analysis

Applies to

  • Raw Materials
  • Advanced Materials
  • Photonics
  • Batteries
  • Hydrogen

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