ProductUpdated on 22 August 2025
Nanoprobing solutions
About
Integrated nanoprobing solutions for your SEM, FIB and dual beam.
Perform electrical characterization of microelectronic devices, in situ semiconductor failure analysis and manipulation of single structures under electron microscopes.
Applies to
- High Tech Systems & Materials - Metrology
- High Tech Systems & Materials - Semicon
- High Tech Systems & Materials - Test Technology & Engineering
Attached files
Organisation
Similar opportunities
Service
Electrical Nanoprobing and Failure Analysis
- Others
- Consulting
- Development
- High Tech Systems & Materials - Semicon
- High Tech Systems & Materials - Metrology
- High Tech Systems & Materials - Chip design
- High Tech Systems & Materials - Test Technology & Engineering
Anya Grushina
Marketing and Technical Communications Lead at Imina Technologies at Imina Technologies SA
Zürich, Switzerland
Product
- High Tech Systems & Materials - Semicon
- High Tech Systems & Materials - Metrology
- High Tech Systems & Materials - Test Technology & Engineering
Karl Boche
Sales Manager at Imina Technologies SA
Cugy, Switzerland
Product
- High Tech Systems & Materials - Semicon
- High Tech Systems & Materials - Photonic IC’s
- High Tech Systems & Materials - Test Technology & Engineering
Florian Döring
CEO at XRnanotech
Villigen, Switzerland