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ProductUpdated on 22 August 2025

Nanoprobing solutions

Karl Boche

Sales Manager at Imina Technologies SA

Cugy, Switzerland

About

Integrated nanoprobing solutions for your SEM, FIB and dual beam.

Perform electrical characterization of microelectronic devices, in situ semiconductor failure analysis and manipulation of single structures under electron microscopes.

Applies to

  • High Tech Systems & Materials - Metrology
  • High Tech Systems & Materials - Semicon
  • High Tech Systems & Materials - Test Technology & Engineering

Organisation

Imina Technologies SA

Company

Cugy, Switzerland

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