Metrology solutions for leading fabs, from FEOL to AP

While our tools and software are widely used by leading semiconductor manufacturers, we are nevertheless keen on striking new RnD collaborations here, to expand our capabilities together with you.

We are open to being challenged with new substrates, new structures, new materials and new architectures. We also wish to guide the development of new components to be used in our tools, such as sources and sensors, modules and subsystems.

We are also focused on innovating AI approaches to answer complex industrial needs, so let us know if you have RnD aspirations in that way.